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1

Automated Contour Ordering In Moire Topograms

Pekelsky, James R.

Journal:

Optical Engineering

Year:

1987

Language:

english

File:

PDF, 9.91 MB

english, 1987

2

An imaging grating diffractometer for traceable calibration of grating pitch in the range 20 μm to 350 nm

Brasil, D A, Alves, J A P, Pekelsky, J R

Journal:

Journal of Physics Conference Series

Year:

2015

Language:

english

File:

PDF, 5.00 MB

english, 2015

3

SPIE Proceedings [SPIE 1986 Quebec Symposium - Quebec City, Canada (Tuesday 3 June 1986)] Optical Testing and Metrology - Photometric Ordering Of Ordinary Moire Fringes

Pekelsky, James R., Xinhong, Ding, Grover, Chander P.

Year:

1986

Language:

english

File:

PDF, 11.00 MB

english, 1986

4

Effect of high gas density and energy control on spark width in narrow-gap chambers

J.R. Pekelsky, R.W. Morrison, F. Villa

Journal:

Nuclear Instruments and Methods

Year:

1978

Language:

english

File:

PDF, 1.32 MB

english, 1978

5

Über die Einwirkung von Toxinen auf die corticalen Vasomotorenzentren

Journal:

Zeitschrift für die gesamte Neurologie und Psychiatrie

Year:

1932

Language:

german

File:

PDF, 934 KB

german, 1932

6

Practical magnetron sputtering system for the deposition of optical multilayer coatings

Dobrowolski, J. A., Pekelsky, James R., Pelletier, R., Ranger, M., Sullivan, Brian T., Waldorf, A. J.

Journal:

Year:

1992

Language:

english

File:

PDF, 822 KB

english, 1992

7

Increasing the Range of Unambiguity in Step-Height Measurement with Multiple-Wavelength Interferometry-Application to Absolute Long Gauge Block Measurement

Decker, Jennifer E., Miles, John R., Madej, Alan A., Siemsen, Ralph F., Siemsen, Klaus J., Bonth, Sebastian de, Bustraan, Krijn, Temple, Sara, Pekelsky, James R.

Journal:

Year:

2003

Language:

english

File:

PDF, 318 KB

english, 2003

8

A multiple frequency heterodyne technique for the measurement of long gauges

Siemsen, K J, Siemsen, R F, Decker, J E, Marmet, L, Pekelsky, J R

Journal:

Year:

1996

Language:

english

File:

PDF, 197 KB

english, 1996

9

Final Report on SIM.L-K1 (SIM.4.2) Regional Comparison. Stage One: Calibration of gauge blocks by optical interferometry

Decker, J E, Altschuler, J, Beladie, H, Malinovsky, I, Prieto, E, Stoup, J, Titov, A, Viliesid, M, Pekelsky, J R

Journal:

Year:

2007

Language:

english

File:

PDF, 385 KB

english, 2007

10

Evaluation of uncertainty in grating pitch measurement by optical diffraction using Monte Carlo methods

Decker, Jennifer E, Eves, B J, Pekelsky, J R, Douglas, R J

Journal:

Measurement Science and Technology

Year:

2011

Language:

english

File:

PDF, 715 KB

english, 2011

11

A new instrument for the dimensional characterization of piston–cylinder units

Miles, John R, Munro, Lorne E, Pekelsky, James R

Journal:

Year:

2005

Language:

english

File:

PDF, 429 KB

english, 2005

12

SIM.4.2 Regional Comparison Stage Two: Calibration of gauge blocks by mechanical comparison

Decker, J E, Alschuler, J, Candanedo, J Castillo, cruz, E De la, Esteban, E Prieto, Morales, R, Oliveira, J C Valente de, Stone, J, Stoup, J, Pekelsky, J R

Journal:

Year:

2003

Language:

english

File:

PDF, 144 KB

english, 2003

13

Report on an international comparison of one-dimensional (1D) grating pitch

Decker, Jennifer E, Buhr, E, Diener, A, Eves, B, Kueng, A, Meli, F, Pekelsky, J R, Pan, S-P, Yao, B-C

Journal:

Year:

2009

Language:

english

File:

PDF, 254 KB

english, 2009

14

SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] Recent Developments in Optical Gauge Block Metrology - Uncertainty of gauge block calibration by mechanical comparison: a worked example for gauge blocks of dissimilar materials

Decker, Jennifer E., Ulrich, Anthony, Pekelsky, James R., Decker, Jennifer E., Brown, Nicholas

Year:

1998

Language:

english

File:

PDF, 990 KB

english, 1998

15

Uncertainty evaluation for the measurement of gauge blocks by optical interferometry

J. E. Decker, J. R. Pekelsky

Year:

1997

Language:

english

File:

PDF, 270 KB

english, 1997

16

Imaging laser diffractometer for traceable grating pitch calibration

J. R. Pekelsky, B. J. Eves, P. R. Nistico, J. E. Decker

Year:

2007

Language:

english

File:

PDF, 274 KB

english, 2007

17

Uncertainty evaluation of the NRC imaging diffractometer

Eves, B J, Pekelsky, J R, Decker, J E

Journal:

Measurement Science and Technology

Year:

2008

Language:

english

File:

PDF, 318 KB

english, 2008

18

NORAMET comparison of gauge block measurement by optical interferometry

Decker, J E, Lapointe, A, Stoup, J, Alonso, M Viliesid, Pekelsky, J R

Journal:

Year:

1999

Language:

english

File:

PDF, 234 KB

english, 1999

19

SPIE Proceedings [SPIE Electronic Imaging 2007 - San Jose, CA (Sunday 28 January 2007)] Videometrics IX - Traceable 3D imaging metrology

Beraldin, J.-Angelo, Rioux, Marc, Cournoyer, Luc, Blais, Francois, Picard, Michel, Pekelsky, Jim, Beraldin, J.-Angelo, Remondino, Fabio, Shortis, Mark R.

Year:

2007

Language:

english

File:

PDF, 1.29 MB

english, 2007

20

SPIE Proceedings [SPIE 25th Annual Technical Symposium - San Diego (Monday 24 August 1981)] Airborne Reconnaissance V - Motion-Error Immunity In Photo Coordinate Determination-A Novel Approach To The Absolute Comparator

Pekelsky, James R., Bannach, Robert J.

Year:

1981

Language:

english

File:

PDF, 611 KB

english, 1981

21

SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, California, USA (Sunday 31 July 2005)] Recent Developments in Traceable Dimensional Measurements III - Bootstrap calibration of an autocollimator, index table and sine bar ensemble for angle metrology

Pekelsky, James R., Decker, Jennifer E., Peng, Gwo-Sheng, Munro, Lorne E.

Year:

2005

Language:

english

File:

PDF, 854 KB

english, 2005

22

SPIE Proceedings [SPIE 1985 International Technical Symposium/Europe - Cannes, France (Monday 25 November 1985)] Biostereometrics '85 - Automated Contour Ordering In Moird Topograms For Biostereometrics

Pekelsky, James R., Coblentz, A. M., Herron, Robin E.

Year:

1986

Language:

english

File:

PDF, 10.93 MB

english, 1986

23

SPIE Proceedings [SPIE 1988 Los Angeles Symposium--O-E/LASE '88 - Los Angeles, CA (Monday 11 January 1988)] Image Processing, Analysis, Measurement, and Quality - Real-Time Measurement Systems For Colour CRT Characterization

Pekelsky, J R., Cowan, W B., Rowell, N L., Hughes, Gary W., Mantey, Patrick E., Rogowitz, Bernice E.

Year:

1988

Language:

english

File:

PDF, 339 KB

english, 1988

24

SPIE Proceedings [SPIE Lasers in Metrology and Art Conservation - Munich, Germany (Monday 18 June 2001)] Recent Developments in Traceable Dimensional Measurements - Two-part study toward lowest uncertainty calibration of ceramic gauge blocks: interferometry and mechanical comparison techniques

Decker, Jennifer E., Decker, Jennifer E., Brown, Nicholas, Ulrich, Anthony, LaPointe, Alain, Viliesid, Miguel, Pekelsky, James R.

Year:

2001

Language:

english

File:

PDF, 134 KB

english, 2001

25

[IEEE Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1973 - Varennes, Quebec, Canada (1973.10.29-1973.10.31)] Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1973 - Kerr effect studies of space charge movement in nitrobenzene under conditions of field reversal

Morrison, R. W., Pekelsky, J. R.

Year:

1973

Language:

english

File:

PDF, 2.18 MB

english, 1973

26

The Optical System of the NRC ANAPLOT

Journal:

The Canadian Surveyor

Year:

1979

Language:

english

File:

PDF, 2.45 MB

english, 1979

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